Prozessbezogene Diagnosequalität im Kontext von Schullaufbahnentscheidungen
van Ophuysen, S.; Behrmann, L.; Schürer, S.
Research article (book contribution) | Peer reviewedDetails about the publication
Publisher: McElvany, N.; Grecu, , A. L.; Lorenz, R.; Becker, M.; Dignath, C.; Gaspard, H.; Lauermann, F.
Book title: Jahrbuch der Schulentwicklung (Volume 20)
Page range: 72-96
Publishing company: Beltz Verlag
Place of publication: Weinheim
Status: Published
Release year: 2023
Language in which the publication is written: German
Keywords: Grundschulübergang; Prozessbezogene Diagnostik
Authors from the University of Münster
| Behrmann, Lars | Institute of Educational Sciences (IfE) |
| Schürer, Sina | Institute of Educational Sciences (IfE) |
| van Ophuysen, Stefanie | Professorship for methods of empirical educational research (Prof. van Ophuysen) |