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Prozessbezogene Diagnosequalität im Kontext von Schullaufbahnentscheidungen
van Ophuysen, S.; Behrmann, L.; Schürer, S.
Research article (book contribution)
Details about the publication
Editors:
McElvany, N.; Grecu, , A. L.; Lorenz, R.; Becker, M.; Dignath, C.; Gaspard, H.; Lauermann, F.
Book title:
Jahrbuch der Schulentwicklung (Volume 20)
Page range:
72-96
Publisher:
Beltz Verlag
Place of publication:
Weinheim
Status:
Published
Release year:
2023
Language in which the publication is written:
German
Keywords:
Grundschulübergang; Prozessbezogene Diagnostik
Authors from the University of Münster
Behrmann
,
Lars
Institute of Educational Sciences
(IfE)
Schürer
,
Sina
Institute of Educational Sciences
(IfE)
van Ophuysen
,
Stefanie
Professorship for methods of empirical educational research (Prof. van Ophuysen)