Experimental and theoretical studies on self-diffusion in amorphous germanium

Böckendorf, Tim; Kirschbaum, Jan; Kipke, Felix; Bougeard, Dominique; Hansen, Lundsgaard John; Larsen, Nylandsted Arne; Posselt, Matthias; Bracht, Hartmut (2024)
In: AIP Advances, 14(6)
Type of Publication: Research article (journal)

Diffusion of boron in germanium at 800–900 °C revisited

Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020)
In: Journal of Applied Physics, 127
Type of Publication: Research article (journal)

Comparison of experimental STEM conditions for Fluctuation Electron Microscopy

Radić Drazen, Hilke Sven, Peterlechner Martin, Posselt Matthias, Wilde Gerhard, Bracht Hartmut (2020)
In: Microscopy and Microanalysis, 2020
Type of Publication: Research article (journal)

Quantitative scanning spreading resistance microscopy on n-type dopant diffusion profiles in germanium and the origin of dopant deactivation

Prüßing Jan K., Hamdana Gerry, Bougeard Dominique , Peiner Erwin, Bracht Hartmut (2019)
In: Journal of Applied Physics, 125(085105)
Type of Publication: Research article (journal)

Fluctuation electron microscopy on silicon amorphized at varying self ion-implantation conditions

Radić D, Hilke S, Peterlechner M, Posselt M, Bracht H (2019)
In: Journal of Applied Physics, 126
Type of Publication: Research article (journal)

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Experimental and theoretical studies on self-diffusion in amorphous germanium Böckendorf, Tim; Kirschbaum, Jan; Kipke, Felix; Bougeard, Dominique; Hansen, Lundsgaard John; Larsen, Nylandsted Arne; Posselt, Matthias; Bracht, Hartmut (2024) In: AIP Advances, 14(6) Type of Publication: Research article (journal)
Focused Ion Beam Sample Preparation for In Situ Thermal and Electrical Transmission Electron Microscopy Radić D, Peterlechner M, Bracht H (2021) In: Microscopy and Microanalysis, 27(4) Type of Publication: Research article (journal)
Diffusion of boron in germanium at 800–900 °C revisited Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020) In: Journal of Applied Physics, 127 Type of Publication: Research article (journal)
Defect distribution in boron doped silicon nanostructures characterized by means of scanning spreading resistance microscopy Prüßing J, Böckendorf T, Hamdana G, Peiner E, Bracht H (2020) In: Journal of Applied Physics, 127 Type of Publication: Research article (journal)
Comparison of experimental STEM conditions for Fluctuation Electron Microscopy Radić Drazen, Hilke Sven, Peterlechner Martin, Posselt Matthias, Wilde Gerhard, Bracht Hartmut (2020) In: Microscopy and Microanalysis, 2020 Type of Publication: Research article (journal)
Self-Holding Optical Actuator Based on a Mixed Ionic–Electronic Conductor Material Muñoz-Castro M, Walter N, Prüßing Jan K., Pernice W, Bracht H, (2019) In: ACS Photonics, 6(5) Type of Publication: Research article (journal)
Quantitative scanning spreading resistance microscopy on n-type dopant diffusion profiles in germanium and the origin of dopant deactivation Prüßing Jan K., Hamdana Gerry, Bougeard Dominique , Peiner Erwin, Bracht Hartmut (2019) In: Journal of Applied Physics, 125(085105) Type of Publication: Research article (journal)
Analysis of medium-range order based on simulated segmented ring detector STEM-images: amorphous Si Hilke Sven, Kirschbaum Jan, Hieronymus-Schmidt Vitalij, Radek Manuel, Bracht Hartmut, Wilde Gerhard, Peterlechner Martin (2019) In: Ultramicroscopy, 200 Type of Publication: Research article (journal)
Fluctuation electron microscopy on silicon amorphized at varying self ion-implantation conditions Radić D, Hilke S, Peterlechner M, Posselt M, Bracht H (2019) In: Journal of Applied Physics, 126 Type of Publication: Research article (journal)
Structural and Thermal Characterisation of Nanofilms by Time-Resolved X-ray Scattering Plech A, Krause B, Baumbach T, Zakharova M, Eon S, Girmen C, Buth G, Bracht H (2019) In: Nanomaterials, 9 Type of Publication: Research article (journal)