Structural and Thermal Characterisation of Nanofilms by Time-Resolved X-ray Scattering
Plech A, Krause B, Baumbach T, Zakharova M, Eon S, Girmen C, Buth G, Bracht H
Research article (journal) | Peer reviewedDetails about the publication
Journal: Nanomaterials
Volume: 9
Status: Published
Release year: 2019
Language in which the publication is written: English
DOI: 10.3390/nano9040501
Authors from the University of Münster
| Bracht, Hartmut | |
| Eon, Soizic | |
| Eon, Soizic |