Experimental and theoretical studies on self-diffusion in amorphous germanium
Böckendorf, Tim; Kirschbaum, Jan; Kipke, Felix; Bougeard, Dominique; Hansen, Lundsgaard John; Larsen, Nylandsted Arne; Posselt, Matthias; Bracht, Hartmut
Research article (journal) | Peer reviewedDetails about the publication
Journal: AIP Advances
Volume: 14
Issue: 6
Page range: 065129null
Status: Published
Release year: 2024 (20/06/2024)
Language in which the publication is written: English
DOI: 10.1063/5.0183578
Link to the full text: https://doi.org/10.1063/5.0183578
Keywords: SIMS, germanium, semiconductor, diffusion, self-diffusion, amorphous
Authors from the University of Münster
| Böckendorf, Tim | |
| Bracht, Hartmut | |
| Kipke, Felix |