Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers
Heil T., Stender P., Schmitz G., Kohl H.
Research article (journal) | Peer reviewedDetails about the publication
Journal: Microscopy and Microanalysis
Volume: 13
Issue: 3
Page range: 398-399
Status: Published
Release year: 2007
Language in which the publication is written: English
Authors from the University of Münster
| Heil, Tobias | Institute of Physics (PI) |
| Kohl, Helmut | Workgroup electron microscopy (Prof. Kohl) |
| Schmitz, Guido | Institute of Materials Physics |
| Stender, Patrick | Institute of Materials Physics |