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Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomography Stender P, Heil T, Kohl H, Schmitz G (2009) In: Ultramicroscopy, 109(5), 612-618. doi:10.1016/j.ultramic.2008.12.009 Research article (journal) \| Peer reviewed \| Published
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers Heil T., Stender P., Schmitz G., Kohl H. (2008) In: Luysberg M., Tillann K., Weirich T. (eds.), EMC 2008, 385-385. Berlin: Springer. Research article in edited proceedings (conference) \| Published
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers Heil T., Stender P., Schmitz G., Kohl H. (2007) In: Microscopy and Microanalysis, 13(3), 398-399. doi:10.1017/S1431927607081998 Research article (journal) \| Peer reviewed \| Published