Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers
Heil T., Stender P., Schmitz G., Kohl H.
Research article in edited proceedings (conference)Details about the publication
Publisher: Luysberg M., Tillann K., Weirich T.
Book title: EMC 2008
Page range: 385-385
Publishing company: Springer
Place of publication: Berlin
Status: Published
Release year: 2008
Language in which the publication is written: English
Conference: EUROPEAN MICROSCOPY CONGRESS, Aachen, undefined
Authors from the University of Münster
| Heil, Tobias | Institute of Physics (PI) |
| Kohl, Helmut | Workgroup electron microscopy (Prof. Kohl) |
| Schmitz, Guido | Institute of Materials Physics |
| Stender, Patrick | Institute of Materials Physics |