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Characterising Interlayer Excitons by Spectral Signature in Scattering Visible Near-Field MicroscopyOpen Access

Garrity, O.; Niehues, I.; Bergmann-Iwe, A.; Wróblewska, A.; Pirker, L.; Bukhari,A.; Hlawacek, G.; Korn, T.; Frank, O.; Kusch, P.

Research article (journal) | Peer reviewed

Details about the publication

Journal: Journal of Physical Chemistry Letters
Volume: 16
Issue: 27
Page range: 6960-6967
Status: Published
Release year: 2025
DOI: 10.1021/acs.jpclett.5c01052
Keywords: Near-field optics; SNOM; 2D Materials; Interlayer excitons

Authors from the University of Münster

Niehues, Iris
Junior professorship of experimental physics (Prof. Niehues)