Comparing Kinetic Monte Carlo and Thin-Film Modeling of Transversal Instabilities of Ridges on Patterned Substrates

Tewes W, Buller O, Heuer A, Thiele U, Gurevich SV

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

We employ kinetic Monte Carlo (KMC) simulations and a thin-film continuum model to comparatively study the transversal (i.e., Plateau-Rayleigh) instability of ridges formed by molecules on pre-patterned substrates. It is demonstrated that the evolution of the occurring instability qualitatively agrees between the two models for a single ridge as well as for two weakly interacting ridges. In particular, it is shown for both models that the instability occurs on well defined length and time scales which are, for the KMC model, significantly larger than the intrinsic scales of thermodynamic fluctuations. This is further evidenced by the similarity of dispersion relations characterizing the linear instability modes.

Details zur Publikation

FachzeitschriftJournal of Chemical Physics
Jahrgang / Bandnr. / Volume146
Ausgabe / Heftnr. / Issue9
Artikelnummer094704
StatusVeröffentlicht
Veröffentlichungsjahr2017
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1063/1.4977739
StichwörterKinetic Monte Carlo, Thin-Film Modeling

Autor*innen der Universität Münster

Buller, Oleg
Professur für Theorie komplexer Systeme (Prof. Heuer)
Gurevich, Svetlana
Professur für Theoretische Physik (Prof. Thiele)
Center for Nonlinear Science (CeNoS)
Center for Multiscale Theory and Computation (CMTC)
Heuer, Andreas
Professur für Theorie komplexer Systeme (Prof. Heuer)
Center for Nonlinear Science (CeNoS)
Center for Multiscale Theory and Computation (CMTC)
Tewes, Walter
Professur für Theoretische Physik (Prof. Thiele)
Thiele, Uwe
Professur für Theoretische Physik (Prof. Thiele)
Center for Nonlinear Science (CeNoS)
Center for Multiscale Theory and Computation (CMTC)