Comparing Kinetic Monte Carlo and Thin-Film Modeling of Transversal Instabilities of Ridges on Patterned Substrates

Tewes W, Buller O, Heuer A, Thiele U, Gurevich SV

Research article (journal) | Peer reviewed

Abstract

We employ kinetic Monte Carlo (KMC) simulations and a thin-film continuum model to comparatively study the transversal (i.e., Plateau-Rayleigh) instability of ridges formed by molecules on pre-patterned substrates. It is demonstrated that the evolution of the occurring instability qualitatively agrees between the two models for a single ridge as well as for two weakly interacting ridges. In particular, it is shown for both models that the instability occurs on well defined length and time scales which are, for the KMC model, significantly larger than the intrinsic scales of thermodynamic fluctuations. This is further evidenced by the similarity of dispersion relations characterizing the linear instability modes.

Details about the publication

JournalJournal of Chemical Physics
Volume146
Issue9
Article number094704
StatusPublished
Release year2017
Language in which the publication is writtenEnglish
DOI10.1063/1.4977739
KeywordsKinetic Monte Carlo, Thin-Film Modeling

Authors from the University of Münster

Buller, Oleg
Professorship of Theory of Complex Systems
Gurevich, Svetlana
Professur für Theoretische Physik (Prof. Thiele)
Center for Nonlinear Science
Center for Multiscale Theory and Computation
Heuer, Andreas
Professorship of Theory of Complex Systems
Center for Nonlinear Science
Center for Multiscale Theory and Computation
Tewes, Walter
Professur für Theoretische Physik (Prof. Thiele)
Thiele, Uwe
Professur für Theoretische Physik (Prof. Thiele)
Center for Nonlinear Science
Center for Multiscale Theory and Computation