Quantitative strain and topography mapping of 2D materials using nanobeam electron diffraction
Sickel, J.; Asbach, M.; Gammer, C.; Bratschitsch, R.; and Kohl, H.
Research article (journal) | Peer reviewedDetails about the publication
Journal: Microscopy and Microanalysis
Volume: 28
Issue: 3
Page range: 701-715
Status: Published
Release year: 2022 (01/04/2022)
Language in which the publication is written: English
Keywords: 2D materials; monolayer; NBED; strain; topography
Authors from the University of Münster
| Bratschitsch, Rudolf | Workgroup ultrafast solid-state quantum optics and nanophotonics (Prof. Bratschitsch) |