Combination of micro X-ray fluorescence spectroscopy and time-of-flight secondary ion mass spectrometry imaging for the marker-free detection of CeO2 nanoparticles in tissue sections

Veith L, Dietrich D, Vennemann A, Breitenstein D, Engelhard C, Karst U, Sperling M, Wiemann M, Hagenhoff B

Research article (journal) | Peer reviewed

Details about the publication

JournalJournal of Analytical Atomic Spectrometry
Volume33
Issue3
Page range491-501
StatusPublished
Release year2018
Language in which the publication is writtenEnglish

Authors from the University of Münster

Dietrich, Dörthe
Karst, Uwe
Sperling, Michael
Veith, Lothar