Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials
Taghavi N S, Gant P, Huang P, Niehues I, Schmidt R, Michaelis de Vasconcellos S, Bratschitsch R, García-Hernández M, Frisenda R, and Castellanos-Gomez A
Research article (journal) | Peer reviewedDetails about the publication
Journal: Nano Research
Volume: 12
Issue: 7
Page range: 1691-1695
Status: Published
Release year: 2019
Language in which the publication is written: English
Authors from the University of Münster
| Bratschitsch, Rudolf | Workgroup ultrafast solid-state quantum optics and nanophotonics (Prof. Bratschitsch) |
| Michaelis de Vasconcellos, Steffen | Workgroup ultrafast solid-state quantum optics and nanophotonics (Prof. Bratschitsch) |
| Niehues, Iris | Workgroup ultrafast solid-state quantum optics and nanophotonics (Prof. Bratschitsch) |
| Schmidt, Robert | Workgroup ultrafast solid-state quantum optics and nanophotonics (Prof. Bratschitsch) |