Characterization of Special Grain Boundaries and Triple Junctions in CuxNi1-x Alloys upon Deformation and Annealing

Emeis F, Leuthold J, Spangenberg K, Peterlechner M, Wilde G

Research article (journal) | Peer reviewed

Abstract

We compare two quantities to describe a microstructure: the length fraction of Σ3/ Σ9‐grain boundaries and the number fraction of Σ3‐x‐x/ Σ3‐ Σ3‐ Σ9‐triple junctions using Cu, Ni and four of their alloys in several microstructural states. The fractions of Σ3‐grain boundaries show similar tendencies as the respective fractions of Σ3‐x‐x‐triple junctions in relation to the grain size upon deformation and annealing. However, the fraction of Σ9‐grain boundaries stagnates at certain grain sizes, while there is still a considerable change of Σ3‐ Σ3‐ Σ9‐triple junctions during grain growth, meaning that the Σ3‐ Σ3‐ Σ9‐triple junction microstructure is still evolving. To analyze the evolution of the triple junction microstructure, a program, such as pythorient, is necessary.

Details about the publication

JournalAdvanced Engineering Materials
Volume21
Issue4
StatusPublished
Release year2019
Language in which the publication is writtenEnglish
DOI10.1002/adem.201801214
KeywordsCu-Ni alloys; elektrcon backscatter-diffraction (EBSD); severe plastic deformation; triple junctions; twinning

Authors from the University of Münster

Emeis, Friederike
Professorship of Materials Physics (Prof. Wilde)
Leuthold, Jörn
Institute of Materials Physics
Peterlechner, Martin
Professorship of Materials Physics (Prof. Wilde)
Spangenberg, Katharina
Professorship of Materials Physics (Prof. Wilde)
Wilde, Gerhard
Professorship of Materials Physics (Prof. Wilde)