Characterization of Special Grain Boundaries and Triple Junctions in CuxNi1-x Alloys upon Deformation and Annealing

Emeis F, Leuthold J, Spangenberg K, Peterlechner M, Wilde G

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

We compare two quantities to describe a microstructure: the length fraction of Σ3/ Σ9‐grain boundaries and the number fraction of Σ3‐x‐x/ Σ3‐ Σ3‐ Σ9‐triple junctions using Cu, Ni and four of their alloys in several microstructural states. The fractions of Σ3‐grain boundaries show similar tendencies as the respective fractions of Σ3‐x‐x‐triple junctions in relation to the grain size upon deformation and annealing. However, the fraction of Σ9‐grain boundaries stagnates at certain grain sizes, while there is still a considerable change of Σ3‐ Σ3‐ Σ9‐triple junctions during grain growth, meaning that the Σ3‐ Σ3‐ Σ9‐triple junction microstructure is still evolving. To analyze the evolution of the triple junction microstructure, a program, such as pythorient, is necessary.

Details zur Publikation

FachzeitschriftAdvanced Engineering Materials
Jahrgang / Bandnr. / Volume21
Ausgabe / Heftnr. / Issue4
StatusVeröffentlicht
Veröffentlichungsjahr2019
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1002/adem.201801214
StichwörterCu-Ni alloys; elektrcon backscatter-diffraction (EBSD); severe plastic deformation; triple junctions; twinning

Autor*innen der Universität Münster

Emeis, Friederike
Professur für Materialphysik (Prof. Wilde)
Leuthold, Jörn
Institut für Materialphysik
Peterlechner, Martin
Professur für Materialphysik (Prof. Wilde)
Spangenberg, Katharina
Professur für Materialphysik (Prof. Wilde)
Wilde, Gerhard
Professur für Materialphysik (Prof. Wilde)