Pflanzl Nicolas, Breuker Dominic, Dietrich Hanns-Alexander, Steinhorst Matthias, Shitkova Maria, Becker Jörg, Delfmann Patrick
Research article in edited proceedings (conference) | Peer reviewedWe introduce a pattern matching approach for conceptual models suitable for a number of model analysis scenarios like process weakness detection, process compliance checking, syntax verification and model translation. The approach does not depend on any particular modeling language which is achieved by treating conceptual models as labeled graphs. Consequently, we use pattern matching techniques known from algorithmic graph theory – subgraph isomorphism and subgraph homeomorphism. In general, algorithms solving these problems can be computationally expensive. However, special properties of conceptual models such as low treewidth and planarity can be exploited to keep computational complexity manageable. This makes pattern matching appli-cable even to large models typically used in large companies or corporate groups. We introduce a high-level meta algorithm checking structural properties of input models and patterns to decide which low-level pattern matching algorithm will likely deliver search results quickest.
Becker, Jörg | Chair of Information Systems and Information Management (IS) |
Breuker, Dominic | Chair of Information Systems and Information Management (IS) |
Delfmann, Carsten Patrick | Chair of Information Systems and Information Management (IS) |
Dietrich, Hanns-Alexander | Chair of Information Systems and Information Management (IS) |
Neumann, Maria | Chair of Information Systems and Information Management (IS) |
Pflanzl, Nicolas | Databases and Information Systems Group (DBIS) |
Steinhorst, Matthias | Chair of Information Systems and Information Management (IS) |