Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy
Rieger Steffen, Fischedick Markus, Boller Klaus-Jochen, Fallnich Carsten
Research article in edited proceedings (conference) | Peer reviewedDetails about the publication
Status: Published
Release year: 2016 (10/06/2016)
Language in which the publication is written: English
Conference: CLEO - Conference on Lasers and Electro-Optics, San Jose, California, USA, undefined
Authors from the University of Münster
| Fallnich, Carsten | Professur für Angewandte Physik (Prof. Fallnich) |
| Fischedick, Markus | Professur für Angewandte Physik (Prof. Fallnich) |
| Rieger, Steffen | Professur für Angewandte Physik (Prof. Fallnich) |