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Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy
Rieger Steffen, Fischedick Markus, Boller Klaus-Jochen, Fallnich Carsten
Research article in edited proceedings (conference)
| Peer reviewed
Details about the publication
Status:
Published
Release year:
2016 (10/06/2016)
Language in which the publication is written:
English
Conference:
CLEO - Conference on Lasers and Electro-Optics
, San Jose, California, USA
Authors from the University of Münster
Fallnich
,
Carsten
Professur für Angewandte Physik (Prof. Fallnich)
Fischedick
,
Markus
Professur für Angewandte Physik (Prof. Fallnich)
Rieger
,
Steffen
Professur für Angewandte Physik (Prof. Fallnich)