Detecting Spring Configurations Errors
von Hof V, Fögen K, Kuchen H
Research article in edited proceedings (conference) | Peer reviewedDetails about the publication
Editors: Shin Sung Y., Shin Dongwan, Lencastre Maria
Book title: SAC '17 Proceedings of the Symposium on Applied Computing
Publisher: ACM Press
Place of publication: New York, NY, USA
Status: Published
Release year: 2017
Language in which the publication is written: English
Conference: The 32nd ACM Symposium On Applied Computing (SAC '17), Marrakesh, Morocco
ISBN: 978-1-4503-4486-9
Authors from the University of Münster
| Kuchen, Herbert | Practical Computer Science Group (PI) |
| von Hof, Vincent | Practical Computer Science Group (PI) |