Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination.
Pfaff M, Müller E, Klein MF, Colsmann A, Lemmer U, Krzyzanek V, Reichelt R, Gerthsen D
Research article (journal)Abstract
High-angle annular dark-field scanning transmission electron microscopy (HAADF STEM) at low energies (
Details about the publication
Journal: Journal of Microscopy
Volume: 243
Issue: 1
Page range: 31-39
Status: Published
Release year: 2011
Language in which the publication is written: English
Authors from the University of Münster
| Krzyzanek, Vladislav | |
| Reichelt, Rudolf |