Continuous morphology and growth monitoring of different cell types in a single culture using quantitative phase microscopy
Kemper B, Wibbeling J, Kastl L, Schnekenburger J, Ketelhut S
Research article in edited proceedings (conference)Details about the publication
Status: Published
Release year: 2015
Language in which the publication is written: English
Conference: SPIE Optical Metrology, Munich
Authors from the University of Münster
| Kastl, Lena | |
| Kemper, Björn | |
| Schnekenburger, Jürgen |