Interlaboratory comparison of XRF analysis on thin films, including alloys, oxides, multilayers, and a lithium-ion battery material
Wählisch, Andre, Streeck, Cornelia, Stenzel Yannick P, Nowak, Sascha, Osenberg, Markus, Manke, Ingo, Fartmann, Michael, Hagenhoff, Birgit, Unterumsberger. Rainer, Wansleben, Malte, Anklamm, Lars, Krämer, Markus, Gawlitza, Peter, Blokhina, Elena, Beckhoff, Burkhard
Research article (journal) | Peer reviewedDetails about the publication
Journal: Journal of Analytical Atomic Spectrometry
Volume: 41
Page range: 1869-1882
Status: Published
Release year: 2026
Language in which the publication is written: English
DOI: 10.1039/D5JA00460H
Keywords: LIBs; TXRF; Round Robin
Authors from the University of Münster
| Nowak, Sascha | |
| Stenzel, Yannick Philipp |