Atom probe tomography of heterogeneous dielectric materials
Schmitz G. Greiwe G., Oberdorfer C., Stender P.
Research article in edited proceedings (conference) | Peer reviewedDetails about the publication
Publisher: Solorzano G., de Souza W.
Book title: Proceedings of IMC 17
Page range: 310-310
Status: Published
Release year: 2010
Language in which the publication is written: English
Conference: International Microscopy Congress 17, Rio de Janeiro, undefined
Authors from the University of Münster
| Greiwe, Gerd-Hendrik | Professur für Materialphysik I (Prof. Schmitz) |
| Oberdorfer, Christian | Institute of Materials Physics |
| Schmitz, Guido | Institute of Materials Physics |
| Stender, Patrick | Institute of Materials Physics |