Nanoanalysis of Interfacial Chemistry
Schmitz G, Ene C, Galinski H, Schlesiger R, Stender P
Research article (journal) | Peer reviewedAbstract
In recent years atom probe tomography has advanced to an outstanding tool of analyzing interfacial chemistry in nanostructured materials In this article quantitative measurements of the natural width of multilayer interfaces and of segregation at grain boundaries and even at separate triple junctions of the boundary structure are presented and their physical consequences discussed
Details about the publication
Journal: Journal of the Minerals, Metals and Materials Society (JOM)
Volume: 62
Issue: 12
Page range: 58-63
Status: Published
Release year: 2010 (31/12/2010)
Language in which the publication is written: English
Keywords: grain-boundary diffusion tomographic atom-probe triple junctions giant magnetoresistance thin-films segregation microstructure interreaction system energy
Authors from the University of Münster
| Schlesiger, Ralf | Institute of Materials Physics |
| Schmitz, Guido | Institute of Materials Physics |
| Stender, Patrick | Institute of Materials Physics |