Teardown and Characterization of Commercial 18650 Sodium Ion Batteries
Fehlings, Nick; Ihlbrock, Lukas; Hesper, Jakob; Buchmann, Julius; Tsoufios, Alexandros; Winter, Martin; Wiemers-Meyer, Simon; Nowak, Sascha
Poster | Peer reviewedDetails about the publication
Status: Published
Release year: 2025
Language in which the publication is written: English
Conference: The 16th International advanced automotive battery conference, Padova/Venice, Germany
Keywords: SIB, NIB, Teardown, 18650
Authors from the University of Münster
| Buchmann, Julius Otto | |
| Fehlings, Nick | |
| Hesper, Jakob Michael | |
| Ihlbrock, Lukas | |
| Nowak, Sascha | |
| Tsoufios, Alexandros | |
| Wiemers-Meyer, Simon | |
| Winter, Martin |