Design of a laser-assisted tomographic atom probe at Muenster University

Schlesiger R, Oberdorfer C, Wuerz R, Greiwe G, Stender P, Artmeier M, Pelka P, Spaleck F, Schmitz G

Research article (journal) | Peer reviewed

Abstract

To benefit from the latest technical improvements in atom probe analysis, a new tomographic atom probe has been built at the University of Munster, Germany. The instrument utilizes a femtosecond laser system with a high repetition rate combined with the ability of using a micrometer-sized extraction electrode and a wide angle configuration. Since field evaporation is triggered by laser pulses instead of high-voltage pulses, the instrument offers the ability to expand the range of analyzed materials to poorly conducting or insulating materials such as oxides, glasses, ceramics, and polymeric materials. The article describes the design of the instrument and presents characterizing measurements on metals, semiconductors, and oxide ceramic.

Details about the publication

JournalReview of Scientific Instruments (Rev. Sci. Instrum.)
Volume81
Issue4
Page range043703-1-043703-8
StatusPublished
Release year2010
Language in which the publication is writtenEnglish
DOI10.1063/1.3378674
Keywordsatom probe field ion microscopy; laser beam applications; microelectrodes; tomography

Authors from the University of Münster

Greiwe, Gerd-Hendrik
Professur für Materialphysik I (Prof. Schmitz)
Oberdorfer, Christian
Institute of Materials Physics
Schlesiger, Ralf
Institute of Materials Physics
Schmitz, Guido
Institute of Materials Physics
Stender, Patrick
Institute of Materials Physics