Design of a laser-assisted tomographic atom probe at Muenster University

Schlesiger R, Oberdorfer C, Wuerz R, Greiwe G, Stender P, Artmeier M, Pelka P, Spaleck F, Schmitz G

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

To benefit from the latest technical improvements in atom probe analysis, a new tomographic atom probe has been built at the University of Munster, Germany. The instrument utilizes a femtosecond laser system with a high repetition rate combined with the ability of using a micrometer-sized extraction electrode and a wide angle configuration. Since field evaporation is triggered by laser pulses instead of high-voltage pulses, the instrument offers the ability to expand the range of analyzed materials to poorly conducting or insulating materials such as oxides, glasses, ceramics, and polymeric materials. The article describes the design of the instrument and presents characterizing measurements on metals, semiconductors, and oxide ceramic.

Details zur Publikation

FachzeitschriftReview of Scientific Instruments (Rev. Sci. Instrum.)
Jahrgang / Bandnr. / Volume81
Ausgabe / Heftnr. / Issue4
Seitenbereich043703-1-043703-8
StatusVeröffentlicht
Veröffentlichungsjahr2010
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1063/1.3378674
Stichwörteratom probe field ion microscopy; laser beam applications; microelectrodes; tomography

Autor*innen der Universität Münster

Greiwe, Gerd-Hendrik
Professur für Materialphysik I (Prof. Schmitz)
Oberdorfer, Christian
Institut für Materialphysik
Schlesiger, Ralf
Institut für Materialphysik
Schmitz, Guido
Institut für Materialphysik
Stender, Patrick
Institut für Materialphysik