Inside Back Cover - Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High-Voltage NMC811||SiOx-Containing Cells via Operando ATR-FTIR Spectroscopy
Weiling, Matthias; Lechtenfeld, Christian; Pfeiffer, Felix; Frankenstein, Lars; Diddens, Diddo; Wang, Jian-Fen; Nowak, Sascha; Baghernejad, Masoud
Non-scientific contribution (journal)Details about the publication
Journal: Advanced Energy Materials (Adv. Energy Mater.)
Volume: 14
Issue: 5
Article number: 2470022
Status: Published
Release year: 2024
Language in which the publication is written: English
Keywords: LIBs
Authors from the University of Münster
| Frankenstein, Lars | Münster Electrochemical Energy Technology Battery Research Center (MEET) |
| Lechtenfeld, Christian-Timo | Münster Electrochemical Energy Technology Battery Research Center (MEET) |
| Nowak, Sascha | Münster Electrochemical Energy Technology Battery Research Center (MEET) |