Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020) In: Journal of Applied Physics, 127 Type of Publication: Research article (journal) | |
Südkamp T., Hamdana G., Descoins M., Mangelinck D., Wasisto H., Peiner E., Bracht H. (2018) In: Journal of Applied Physics, 123(16) Type of Publication: Research article (journal) | |
Hamdana G., Südkamp T., Descoins M., Mangelinck D., Caccamo L., Bertke M., Wasisto H., Bracht H., Peiner E. (2017) In: Microelectronic Engineering, 179(null) Type of Publication: Research article (journal) | |
Hamdana G., Bertke M., Südkamp T., Bracht H., Wasisto H., Peiner E. (2017) In: (eds.), . SPIE. Type of Publication: Research article in edited proceedings (conference) | |
Kujala J., Südkamp T., Slotte J., Makkonen I., Tuomisto F., Bracht H. (2016) In: Journal of Physics: Condensed Matter, 28(33) Type of Publication: Research article (journal) |
Characterization of atomic transport in nano-structured silicon and germanium to reveal properties of self- and foreign-atom defects Candidate: Südkamp, Tobias | Supervisors: Bracht, Hartmut Period of time: until 20/07/2018 Doctoral examination procedure finished at: Doctoral examination procedure at University of Münster |