Tobias Südkamp

No current affiliations available for this person. The person is no longer active at the university.

Publications

Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020)
In: Journal of Applied Physics, 127
Type of Publication: Research article (journal)
Südkamp T., Hamdana G., Descoins M., Mangelinck D., Wasisto H., Peiner E., Bracht H. (2018)
In: Journal of Applied Physics, 123(16)
Type of Publication: Research article (journal)
Hamdana G., Südkamp T., Descoins M., Mangelinck D., Caccamo L., Bertke M., Wasisto H., Bracht H., Peiner E. (2017)
In: Microelectronic Engineering, 179(null)
Type of Publication: Research article (journal)
Hamdana G., Bertke M., Südkamp T., Bracht H., Wasisto H., Peiner E. (2017)
In: (eds.), . SPIE.
Type of Publication: Research article in edited proceedings (conference)
Kujala J., Südkamp T., Slotte J., Makkonen I., Tuomisto F., Bracht H. (2016)
In: Journal of Physics: Condensed Matter, 28(33)
Type of Publication: Research article (journal)
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Doctorates

Characterization of atomic transport in nano-structured silicon and germanium to reveal properties of self- and foreign-atom defects
Candidate: Südkamp, Tobias | Supervisors: Bracht, Hartmut
Period of time: until 20/07/2018
Doctoral examination procedure finished at: Doctoral examination procedure at University of Münster