Tobias Südkamp
No current affiliations available for this person. The person is no longer active at the university.
Publications
Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020) In: Journal of Applied Physics, 127. doi:10.1063/1.5134537 Research article (journal) | Peer reviewed | Published | |
Südkamp T., Hamdana G., Descoins M., Mangelinck D., Wasisto H., Peiner E., Bracht H. (2018) In: Journal of Applied Physics, 123(16). doi:10.1063/1.4996987 Research article (journal) | Peer reviewed | Published | |
Hamdana G., Südkamp T., Descoins M., Mangelinck D., Caccamo L., Bertke M., Wasisto H., Bracht H., Peiner E. (2017) In: Microelectronic Engineering, 179(null), 74-82. doi:10.1016/j.mee.2017.04.030 Research article (journal) | Peer reviewed | Published | |
Hamdana G., Bertke M., Südkamp T., Bracht H., Wasisto H., Peiner E. (2017) In: (eds.), . SPIE. doi:10.1117/12.2264995 Research article in edited proceedings (conference) | Peer reviewed | Published | |
Kujala J., Südkamp T., Slotte J., Makkonen I., Tuomisto F., Bracht H. (2016) In: Journal of Physics: Condensed Matter, 28(33). doi:10.1088/0953-8984/28/33/335801 Research article (journal) | Peer reviewed | Published |
Doctorates
| Characterization of atomic transport in nano-structured silicon and germanium to reveal properties of self- and foreign-atom defects Candidate: Südkamp, Tobias | Supervisors: Bracht, Hartmut Period of time: until 20/07/2018 Doctoral examination procedure finished at: Doctoral examination procedure at University of Münster |