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Diffusion of boron in germanium at 800–900 °C revisited Kipke F, Südkamp T, Prüßing J, Bougeard D, Bracht H (2020) In: Journal of Applied Physics, 127. Research article (journal)
Defect distribution in boron doped silicon nanostructures characterized by means of scanning spreading resistance microscopy Prüßing J, Böckendorf T, Hamdana G, Peiner E, Bracht H (2020) In: Journal of Applied Physics, 127. Research article (journal)
Quantitative scanning spreading resistance microscopy on n-type dopant diffusion profiles in germanium and the origin of dopant deactivation Prüßing Jan K., Hamdana Gerry, Bougeard Dominique , Peiner Erwin, Bracht Hartmut (2019) In: Journal of Applied Physics, 125(085105). Research article (journal)
Self-Holding Optical Actuator Based on a Mixed Ionic–Electronic Conductor Material Muñoz-Castro M, Walter N, Prüßing JK, Pernice W, Bracht H (2019) In: ACS Photonics, 2019, 6, 5, 1182–1190. Research article (journal)