Analysis of transverse Anderson localization in refractive index structures with customized random potential

Boguslawski Martin, Brake Sebastian, Armijo Julien, Diebel Falko, Rose Patrick, Denz Cornelia

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

We present a method to demonstrate Anderson localization in an optically induced randomized potential. By usage of computer controlled spatial light modulators, we are able to implement fully randomized nondiffracting beams of variable structural size in order to control the modulation length (photonic grain size) as well as the depth (disorder strength) of a random potential induced in a photorefractive crystal. In particular, we quantitatively analyze the localization length of light depending on these two parameters and find that they are crucial influencing factors on the propagation behavior leading to variably strong localization. Thus, we corroborate that transverse light localization in a random refractive index landscape strongly depends on the character of the potential, allowing for a flexible regulation of the localization strength by adapting the optical induction configuration.

Details zur Publikation

FachzeitschriftOptics Express (Opt. Express)
Jahrgang / Bandnr. / Volume21
Ausgabe / Heftnr. / Issue26
Seitenbereich31713-31724
StatusVeröffentlicht
Veröffentlichungsjahr2013 (16.12.2013)
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1364/OE.21.031713
StichwörterSpeckle; Volume gratings; Invariant optical fields; Wave propagation; Spatial light modulators

Autor*innen der Universität Münster

Boguslawski, Martin
Professur für Angewandte Physik (Prof. Denz)
Brake, Sebastian
Physikalisches Institut (PI)
Denz, Cornelia
Professur für Angewandte Physik (Prof. Denz)
Diebel, Falko
Professur für Angewandte Physik (Prof. Denz)
Rose, Patrick
Professur für Angewandte Physik (Prof. Denz)