Ultrafast diffusion and internal porosity in ultrafine-grained copper-lead alloy prepared by equal channel angular pressing

Ribbe J, Baither D, Schmitz G, Divinski SV

Forschungsartikel (Zeitschrift) | Peer reviewed

Zusammenfassung

Room-temperature diffusion of Ni-63 radiotracer in ultrafine-grained Cu-1 wt.%Pb alloy prepared by equal channel angular pressing reveals the existence of ultrafast transport paths. Some of these paths remain in the material even after complete recrystallization. Using the focused ion beam technique, numerous cracks/pores are revealed. Long-range tracer penetration over tens of micrometers proves that this internal porosity is interconnected by highly diffusive paths. This network of porosity comprises non-equilibrium interfaces, micropores and microcracks. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Details zur Publikation

FachzeitschriftScripta Materialia
Jahrgang / Bandnr. / Volume61
Ausgabe / Heftnr. / Issue2
Seitenbereich129-132
StatusVeröffentlicht
Veröffentlichungsjahr2009 (31.07.2009)
Sprache, in der die Publikation verfasst istEnglisch
DOI10.1016/j.scriptamat.2009.03.029
StichwörterECAP Ultrafine grained microstructure SEM Copper alloys Grain boundary diffusion boundary self-diffusion different purity cu segregation metals ni

Autor*innen der Universität Münster

Baither, Dietmar
Professur für Materialphysik I (Prof. Schmitz)
Divinskyi, Sergii
Professur für Materialphysik (Prof. Wilde)
Ribbe, Jens
Institut für Materialphysik
Schmitz, Guido
Institut für Materialphysik