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Klee’s Measure Problem Made Oblivious

Thießen, Thore; Vahrenhold, Jan

Research article in edited proceedings (conference) | Peer reviewed

Details about the publication

Publisher: Castañeda, Armando; Rodríguez-Henríquez, Francisco
Book title: LATIN 2022: Theoretical Informatics, 15th Latin American Symposium, Guanajuato, Mexico, November 7–11, 2022, Proceedings
Page range: 121-138
Publishing company: Springer
Place of publication: Cham
Title of series: Lecture Notes in Computer Science
Volume of series: 13568
Status: Published
Release year: 2022
Language in which the publication is written: English
Conference: Latin American Symposium on Theoretical Informatics, Guanajuato, Mexico
ISBN: 978-3-031-20623-8
DOI: 10.1007/978-3-031-20624-5_8
Link to the full text: https://rdcu.be/cYOiJ
Keywords: Klee’s measure problem; Oblivious RAM; Data-oblivious algorithms; Data-oblivious divide-and-conquer algorithms

Authors from the University of Münster

Thießen, Thore
Professur für Praktische Informatik (Prof. Vahrenhold)
Vahrenhold, Jan
Professur für Praktische Informatik (Prof. Vahrenhold)