Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces

Green MFB, Wagner C, Leinen P, Deilmann T, Krüger P, Rohlfing M, Tautz FS, Temirov R

Abstract

In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.

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