Technological distance measures – new perspectives on nearby and far away
Simon Hauke, Sick Nathalie
Research article (journal) | Peer reviewedDetails about the publication
Journal: Scientometrics
Volume: 107
Issue: 3
Page range: 1299-1320
Status: Published
Release year: 2016
Language in which the publication is written: English
Authors from the University of Münster
| Sick, Nathalie | |
| Simon, Hauke |