Suppression of resonance Raman scattering via ground state depletion towards sub-diffraction-limited label-free microscopy

Rieger S, Fischedick M, Boller KJ, Fallnich C.

Research article (journal) | Peer reviewed

Details about the publication

JournalOptics Express (Opt. Express)
Volume24
Issue18
Page range20745-20754
StatusPublished
Release year2016 (05/09/2016)
Language in which the publication is writtenEnglish
DOI10.1364/OE.24.020745

Authors from the University of Münster

Fallnich, Carsten
Professur für Angewandte Physik (Prof. Fallnich)
Fischedick, Markus
Professur für Angewandte Physik (Prof. Fallnich)
Rieger, Steffen
Professur für Angewandte Physik (Prof. Fallnich)