Controlling the optical properties of sputtered-deposited LixV2O5 films

Muñoz-Castro M., Berkemeier F., Schmitz G., Buchheit A., Wiemhöfer H.

Abstract

This study examines the influence of lithium intercalation on the optical properties of vanadium pentoxide films. The films with a thickness between 400 and 1000 nm were prepared by DC magnetron sputter deposition. Cyclic voltammetry and chronopotentiometry were used to set a well defined lithiation state of the LixV2O5 films between x = 0 and x = 1. The optical properties of these films were measured by optical reflectometry in the wavelength range between 500 and 1700 nm. From the reflectance data, the refractive index and the extinction coefficient of the films were finally calculated as a function of the wavelength using Cauchy's dispersion model. The results confirm that the optical behavior of LixV2O5 films varies significantly upon lithium insertion. It is demonstrated that the changes produced in the optical properties are completely reversible within the limits of permanent structure changes.