Interface sharpening in miscible Ni/Cu multilayers studied by atom probe tomography

Balogh Z. Chellali M.R., Greiwe G.-H., Schmitz G., Erdelyi Z.

Research article (journal) | Peer reviewed

Abstract

Interfaces of Ni/Cu multilayers were studied by atom probe tomography. To this aim, specimenswith sharp or artificially smeared interfaces were prepared and investigated before and afterannealing at 773 K. Owing to three-dimensional subnanometer resolution of the atom probe, localchemical analysis of layer interfaces becomes possible without interferences of grain boundaries orgeometric roughness. In contrast to the classical expectation for a miscible system, but inagreement with more recent theoretical considerations, diffusion reduces the chemical width of the interfaces by up to 50%.

Details about the publication

JournalApplied Physics Letters (Appl. Phys. Lett.)
Volume99
Page range181902-1-181902-3
StatusPublished
Release year2011
Language in which the publication is writtenEnglish
DOI10.1063/1.3658390

Authors from the University of Münster

Balogh, Zoltán
Professur für Materialphysik I (Prof. Schmitz)
Greiwe, Gerd-Hendrik
Professur für Materialphysik I (Prof. Schmitz)
Schmitz, Guido
Institute of Materials Physics