University of Münster
CRIS@UM
DE | EN

Lithium diffusion in sputter-deposited Li4Ti5O12 thin films

F. Wunde, F. Berkemeier, G. Schmitz

Research article (journal) | Peer reviewed

Abstract

Li4Ti5012 (LTO) thin films are deposited by dc-ion beam spurtering at different oxygen partial pressures and different substrate temperatures. In order to investigate, how these two parameters influence the atomic structure, the specimens are characterized by X-ray diffraction and transmission electron microscopy. Electrochemical characterization of the films is done by cyclic voltammetry and chrono­ potentiometry. To determine an averaged chemical diffusion coefficient of Iithium, a method is devel­ oped, evaluating c-rate tests. The results obtained by this method are compared to results obtained by the weil established galvanostatic intermittent titration technique (GlTT), which is used to determine a concentration dependent diffusion coefficient of Iithium in LTO.

Details about the publication

Journal: Journal of Power Sources
Volume: 215
Page range: 109-115
Status: Published
Release year: 2012
Language in which the publication is written: English
Keywords: Ion beam sp urtering; Lithium ion batteries; Lithium titanium oxide; Chemical diffusion coefficient; GilT

Authors from the University of Münster

Berkemeier, Frank
Professur für Materialphysik I (Prof. Schmitz)
Schmitz, Guido
Institute of Materials Physics
Wunde, Fabian
Professur für Materialphysik I (Prof. Schmitz)