Forces During the Controlled Displacement of Organic Molecules

Langewisch G, Falter J, Fuchs H, Schirmeisen A

Abstract

In the ongoing effort to miniaturize the functional elements in electronic devices, molecular dimensions are currently approached. Scanning probe microscopy has demonstrated fascinating capabilities for bottom-up fabrication of atomically defined prototype structures. However, little is known about the underlying interactions during the manipulation of functional organic molecules with a scanning probe tip. Here, we demonstrate the use of noncontact atomic force microscopy at cryogenic temperatures for the lateral displacement of the organic prototype molecule 3,4,9,10-perylene-tetracarboxylicacid-dianhydride on the Ag(111) surface. During repeated manipulation cycles, we measure the precise lateral and vertical tip-molecule force profiles as well as the energy dissipation before and during the manipulation process. The jump of the molecule to an adjacent equivalent substrate lattice site occurs in the regime of repulsive lateral forces, thus constituting a "pushing" mechanism.