Frisenda R, Drüppel M, Schmidt R, Michaelis de Vasconcellos S, Perez de Lara D, Bratschitsch R, Rohlfing M, and Castellanos-Gomez A (2017) In: ((Bitte Journal prüfen)), 1. doi:10.1038/s41699-017-0013-7 Research article (journal) | Peer reviewed | Published | |
Deilmann T, Drüppel M, Rohlfing M (2016) In: Physical Review Letters, 116(19), 196804. doi:10.1103/PhysRevLett.116.196804 Research article (journal) | Peer reviewed | Published | |
Schmidt, R; Niehues, I; Schneider, R; Drüppel, M; Deilmann, T; Rohlfing, M; Michaelis de
Vasconcellos, S; Castellanos-Gomez, A; Bratschitsch, R (2016) In: 2D Materials, 3, 021011. Research article (journal) | Peer reviewed | Published | |
Drüppel Matthias, Krüger Peter, Rohlfing Michael (2014) In: Physical Review B - Condensed Matter, 90(15). doi:10.1103/PhysRevB.90.155312 Research article (journal) | Peer reviewed | Published |
Electronic and optical properties of atomically thin semiconductors Candidate: Drüppel, Matthias | Supervisors: Rohlfing, Michael; Krüger, Peter Period of time: 01/01/2014 - 30/06/2017 Doctoral examination procedure finished at: Doctoral examination procedure at University of Münster |