Person:
Niehues, I.; Wigger, D.; Kaltenecker, K.; Klein-Hitpass, A.; Roelli, P.; Dąbrowska, A. K.; Ludwiczak, K.; Tatarczak, P.; Becker, J. O.; Schmidt, R.; Schnell, M.; Binder, J.; Wysmołek, A.; Hillenbrand, R. (2025) In: Nanophotonics, 14, 335-342. doi:10.1515/nanoph-2024-0554 Research article (journal) | Peer reviewed | Published | |
Pfeiffer, W; Mueller, N. S.; Hillenbrand, R.; Niehues, I.; Kusch, P. (2025) In: Journal of Microscopy, 1, 1-10. doi:10.1111/jmi.70037 Research article (journal) | Peer reviewed | Published | |
Characterising Interlayer Excitons by Spectral Signature in Scattering Visible Near-Field Microscopy Garrity, O.; Niehues, I.; Bergmann-Iwe, A.; Wróblewska, A.; Pirker, L.; Bukhari,A.; Hlawacek, G.; Korn, T.; Frank, O.; Kusch, P. (2025) In: Journal of Physical Chemistry Letters, 16(27), 6960-6967. doi:10.1021/acs.jpclett.5c01052 Research article (journal) | Peer reviewed | Published | |
Roelli, P; Pascual Robledo, I.; Niehues, I.; Aizpurua, J.; Hillenbrand, R. (2025) In: Light: Science and Applications, 14, 203. doi:10.s41377-025-01855-5 Research article (journal) | Peer reviewed | Published | |
Rogoża, J.; Binder, J.; Voronin, K. V.; Niehues, I.; Ludwiczak, K; Dąbrowska, A. K.; Tokarczyk, M.; Bożek, R.; Nikitin, A. Y.; Hillenbrand, R.; Stępniewski, R.; Wysmołek, A. (2025) In: Nanoscale, 17, 3053-3060. doi:10.1039/D4NR03091E Research article (journal) | Peer reviewed | Published | |
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