Person:
Stiehm, T.; und Wurstbauer, U. (2022) In: Physik Journal, 21(1), 22-23. Research article (journal) | Peer reviewed | Published | |
Niehues I, Blob A, Stiehm T, Michaelis de Vasconcellos S, and Bratschitsch R (2019) In: Nanoscale, 11, 12788-12792. doi:10.1039/C9NR03332G Research article (journal) | Peer reviewed | Published | |
Stiehm T, Schneider R, Kern J, Niehues I, Michaelis de Vasconcellos S, and Bratschitsch R (2019) In: ((Bitte Journal prüfen)), 90. doi:10.1063/1.5100593 Research article (journal) | Peer reviewed | Published | |
Schwermann C, Stiehm T, Tonndorf P, Schneider R, Schmidt R, Kern J, Michaelis de Vasconcellos S, Bratschitsch R, and Doltsinis N L (2018) In: ((Bitte Journal prüfen)), 20, 16918-16923. doi:10.1039/C8CP03052A Research article (journal) | Peer reviewed | Published | |
Niehues I, Blob A, Stiehm T, Schmidt R, Jadriško V, Radatović B, Čapeta D, Kralj M, Michaelis de Vasconcellos S, and Bratschitsch R (2018) In: 2D Materials, 5(3). doi:10.1088/2053-1583/aaba9a Research article (journal) | Peer reviewed | Published | |
Arora A, Noky J, Drüppel M, Jariwala B, Deilmann T, Schneider R, Schmidt R, Del Pozo Zamudio O, Stiehm T, Bhattacharya A, Krüger P, Michaelis de Vasconcellos S, Rohlfing M, and Bratschitsch R (2017) In: Nano Letters, 17, 3202-3207. doi:10.1021/acs.nanolett.7b00765 | Peer reviewed | |
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